Foto | N.º de Parte del Fabricante | Disponibilidad | Cantidad | Hoja de Datos | Serie | Paquete/Caja | Embalaje | Estado del producto | Tipo de lógica | Voltaje de suministro | Número de Bits | Temperatura de funcionamiento | Grado | Calificación | Tipo de montaje | Proveedor Dispositivo Paquete |
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SNJ54ABT8245FKSCAN TEST DEVICES WITH OCTAL BUS Texas Instruments |
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54ABT | 28-CLCC | Tube | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | -55°C ~ 125°C | - | - | Surface Mount | 28-LCCC (11.43x11.43) |
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SN74S1052NSDIODE ARRAY SCHOTT 7V 50MA 20SO Texas Instruments |
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74S | 20-SOIC (0.209", 5.30mm Width) | Tube | Active | Schottky Barrier Diode Bus-Termination Array | - | 16 | 0°C ~ 70°C | - | - | Surface Mount | 20-SO |
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JM38510/07802BEALOOK-AHEAD CARRY GENERATORS 16-C Texas Instruments |
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54S | 16-CDIP (0.300", 7.62mm) | Tube | Active | Look-ahead Carry Generator | 4.5V ~ 5.5V | 4 | -55°C ~ 125°C | - | - | Through Hole | 16-CDIP |
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SNJ54BCT8244AFKSCAN TEST DEVICES WITH OCTAL BUF Texas Instruments |
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54BCT | 28-CLCC | Tube | Active | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | -55°C ~ 125°C | - | - | Surface Mount | 28-LCCC (11.43x11.43) |
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CD54HC297F3AHIGH SPEED CMOS LOGIC DIGITAL PH Texas Instruments |
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54HC | 16-CDIP (0.300", 7.62mm) | Tube | Active | Digital Phase-Locked-Loop Filters | 2V ~ 6V | 4 | -55°C ~ 125°C | - | - | Through Hole | 16-CDIP |
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SNJ54ABT8652JTSCAN TEST DEVICES WITH OCTAL BUS Texas Instruments |
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54ABT | 28-CDIP (0.300", 7.62mm) | Tube | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -55°C ~ 125°C | - | - | Through Hole | 28-CDIP |
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M38510/31202BEA4-BIT BINARY FULL ADDERS WITH FA Texas Instruments |
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54LS | 16-CDIP (0.300", 7.62mm) | Tube | Active | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | -55°C ~ 125°C | - | - | Through Hole | 16-CDIP |
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CD54ACT283F3A4-BIT BINARY FULL ADDER WITH FAS Texas Instruments |
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54ACT | 16-CDIP (0.300", 7.62mm) | Tube | Active | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | -55°C ~ 125°C | - | - | Through Hole | 16-CDIP |
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SNJ54BCT8245AFKSCAN TEST DEVICES WITH OCTAL BUS Texas Instruments |
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54BCT | 28-CLCC | Tube | Active | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | -55°C ~ 125°C | - | - | Surface Mount | 28-LCCC (11.43x11.43) |
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SNJ54BCT8244AJTSCAN TEST DEVICES WITH OCTAL BUF Texas Instruments |
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54BCT | 24-CDIP (0.300", 7.62mm) | Tube | Active | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | -55°C ~ 125°C | - | - | Through Hole | 24-CDIP |